New products
AFM probes with a Full Diamond (FD) tip, attached to a tipless cantilever HA_NC. Each chip contains 1 cantilever with 140 kHz resonance frequency, 3.5 N/m force constant, <25 degrees tip's curvature radius and <10 nm tip's end.

Full Diamond (FD) cantilevers HA_NC/FD consist of standard polysilicon chips and consoles and high quality single crystal diamond needle grown in CVD process and fixed on a lever. Manufacturing a diamond tip with tip's curvature radius less than 10nm and attaching this tip to our own-made polysilicon lever, together with our partners we're glad to present on the market the very special offer: the highest quality AFM tips for routine measurements for the reasonable prices! Our new probes are remarkable for the next features:

  • Full diamond tip is harder than a standard silicone one. Its wear is about 10 times lower and it allows to measure surfaces that grind fast silicon needles. More of all, such cantilevers will be the best for measurements of surface elasticity properties. Their deformation during force curves processing will be minimal respectively to other-material tips;
  • Full Diamond tip has got small cone angle (<25 degrees) and tip's curvature radius (<10 nm) that allows to get high quality scans of various type samples;
  • Low surface energy of diamond makes FD cantilevers to be well-usable for long time scanning of sticky biological samples;
  • Narrow and hard tips are also suitable for simple nanoindentation experiments with standard AFM parts;
  • Experimental results have showed that Full Diamond tips are less sensitive to static charges on sample’s surface. That results in more detailed topography scans in comparison with Si cantilevers in the same conditions

Great utility of FD AFM cantilevers for precise measurements is accompanied by a detailed quality control. After gluing a tip to a lever each cantilever is being observed by SEM before shipment. Thus only good probes reach the customers.

Applications: Scanning sticky biological samples

Our colleague from University of Nebraska Medical Center, Mohtadin Hashemi, have reported about outstanding FD probes utility for measurements of sticky biological samples. He tried both FD and Si probes for scanning of fibril and globular amyloid aggregates. When standard Si tip could be used only for 2-3 hours (then its surface became too dirty, catching sample's material), FD cantilever didn't show any degradation during 7 hours continous repeated scan of the same area. Images from the both sides were taken with 3 hours difference - no tip's or sample's degradation can be noticed.

Applications: Less sensitivity to surface charges

Our experiment have showed that FD cantilevers are less sensitive to effect of image distortion due to surface charges. To the left you may find an image of silver nanoparticles on mica by a standard Si cantilever in low humidity conditions. It took around 1 hour of parameters' adjustment to get this image. The engineer had to decrease contact amplitude of cantilever's oscillation 10 times in respect to free oscillations. To the right you may find a scan of the same surface, obtained by FD probe without any special adjustments. Image is more sharp and particles' sizes are much lower, as they should be in accordance to non-AFM investigation of this sample.

Cantilever specification

Chip thickness H: 0,4mm.
Reflective side coating: Au.
Tip's cone angle: < 25 degrees.
Tip's aspect ratio: > 1:5.
Tip's curvature radius: < 10 nm.
Chip has one rectangular spring.

Cantilever type A Typical dispersion
Length, L (µm) 124 ± 2
Width, W (µm) 34 ± 3
Thickness, H (µm) 1.85 ± 0.15
Force Constant (N/m) 3.5 ±20%
Resonant frequency (kHz) 140 ± 10%



***HA_C/FD probe could be produced with another type of HA_NC lever (235 kHz resonance frequency) by request.

 

$842
Demonstration and training of getting tip enhanced Raman scattering using our TERS AFM cantilevers on a standard test sample.

We're glad to introduce our new service: TERS demostration!

To detect Tip-Enhanced Raman Scattering is a tricky task, which becomes a deal of the independent research for every new type of sample. Before to start such a difficult investigation with the sample targeted it could be reasonable to polish metodology of the experiment with something more simple and reliable. As a starting point the one could took a combination of our TERS-activated cantilevers and specially prepared TERS_S sample. Using this couple experienced engineers from NT-MDT SI get Raman signal enhancement with almost 100% probability.

What could be better to start working with TERS? Only to speak with an experienced AFM-Raman engineer and to see how he gets Raman signal enhancement directly in your lab!

Our new service TERS_D* includes:
 - One day of experienced AFM-Raman engineer's visit. Using our TERS-activated cantilevers and TERS_S sample he will demonstrate Raman signal enhancement in your laboratory. He will explain all his actions and make some important advices that should be remembered for further TERS experiments. Before and during the visit he will also examine configuration of your equipment and recommend some changes (if needed) to maximise Raman response in TERS mode. And of course he will be glad to answer on your questions about Raman measurements and TERS metodology.
 - Three (or more**) TERS-activated cantilevers, 1-3 ones of which will be used for demonstration, while all other ones or still workable will stay in your lab for your own measurements.

Such option could be interesting so for experienced Raman researchers as for starting ones. If you have already gone for test and even obtained some positive results, you should definitely know that correct probes provide 50% of success in TERS experiment. And what is more reliable than take for measurements probes that have just been tested in your lab and were proven to show the correct result?

That is the main reason that we take minimal price*** for arranging a visit. We're absolutely sure in high quality of our probes. And providing TERS_D service we would like to make you to be sure in the same.

* - TERS_D service is available only for the customers of NT-MDT SI AFM-Raman microscopes.

** - addition of every one probe increases the cost of the service by 200 EUR.

*** - TERS_D price is calculated for European region by default. It can slightly vary up and down depending on the flight and the hotel's cost.

$1,982

08.11.2017


Expanding the line of TERS products

It's already 7 years have passed since we manufactured our first TERS-active cantilevers, - and their characteristics and results constantly grow up and improve all this time. Just recently NT-MDT SI engineers have showed TERS in liquid on an opaque sample, using our cantilevers.

And now we're glad to present the new product - TERS demonstration, - which would be interesting so for new AFM-Raman researchers as for experienced specialists.

To detect Tip-Enhanced Raman Scattering is a tricky task, which becomes a deal of the independent research for every new type of sample. Before to start such a difficult investigation with the sample targeted it could be reasonable to polish metodology of the experiment with something more simple and reliable. As a starting point the one could took a combination of our TERS-activated cantilevers and specially prepared TERS_S sample. Using this couple experienced engineers from NT-MDT SI get Raman signal enhancement with almost 100% probability.

What could be better to start working with TERS? Only to speak with an experienced AFM-Raman engineer and to see how he gets Raman signal enhancement directly in your lab!

TERS_D demonstration service includes both 1 day of experienced AFM-Raman engineer's visit and 3 (or more) TERS-activated AFM probes which will stay at the customer's side after demonstration.
Using our TERS-activated cantilevers and TERS_S sample the engineer will demonstrate Raman signal enhancement in your laboratory. He will explain all his actions and make some important advices that should be remembered for further TERS experiments. Before and during the visit he will also examine configuration of your equipment and recommend some changes (if needed) to maximise Raman response in TERS mode. And of course he will be glad to answer on your questions about Raman measurements and TERS metodology.

You may find more info about our new product here.

Here at ScanSens GmbH we allways think about how to make recent acheivements in nanoscience more clear and available to everyone. We hope that the new service of TERS demonstration will help our customers to get excellent results in AFM and Raman using other our products, TERS cantilevers and test sample. If any questions appear, please, don't hesitate to contact our sales manager, Evgeniy Lisov (sales@scansens.com).

You're always welcome!

 

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04.10.2017


New HOPG test samples available

Besides our wide assortment of AFM cantilevers and silicon grating some other products are also very popular between researchers from various countries. Highly oriented pyrolytic graphite is one of such products. This line of products was started many years ago in the restricted set of thickness and dimensions. From the very beginning we suggested that AFM scientists work with similar sample's holder and our assortment will be just enough to satisfy their needs. 

But now we meet very often requests from people, who are not assosiated with scanning probe microscopy at all. HOPG samples application field is very wide due to their structural flexibility and atomic smoothness.

So now, to meet all possible requirements, we decided to broaden our assortment of HOPG samples. We have added several samples of higher lateral size and thickness in all categories from A to H. As usually, you may check the whole assortment at the HOPG and test substrates' part of our web-site.

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24.07.2017


Single crystal diamond AFM probes with high aspect ratio

 

We’re glad to present the new product in our assortment: AFM cantilevers with single crystal diamond (SCD) tips. This type of probes is represented by a very narrow diamond (CVD-grown) needle glued to a standard tipless polysilicon cantilever.

AFM probes prepared by such technology show several features, especially relevant to AFM scans:

  • SCD tip’s cone angle is less than 10 degrees. Thus a diamond needle will get into deep trenches and between high particles, providing detailed topography images.
  • Single crystal diamond tip’s end is very hard. As the result wear of such cantilevers is several times slower than for standard silicon ones. Low deformation of a tip will be a great utility for elasticity investigations and simple nanoindentation or force lithography experiments.
  • SCD tip has got low surface energy and it works well for sticky biological samples.

SCD AFM cantilevers are constantly used by famous NT-MDT application scientists: Sergey Magonov and Marko Surtchev. Thus we’re absolutely sure in quality of these probes.

On the right image the one can see a scan of so-called “Black silicon” relief. Such surface can be constructed by a special etching experiment and is used in solar cells.

Main challenges in visualization of “black silicon” pyramids are their heights that reach 6-7 um. Standard cantilever can’t get between such high and densely grown structures. But as the one may see from the scan, SCD probes worked well. Sharp pyramid’s shape and well-defined flat areas between them approve high quality of the scan.

Now SCD cantilevers are presented in our assortment by the models HA_NC/SCD and HA_C/SCD with the same lever’s parameters as for corresponding ones of ETALON series. But by the request SCD needles can be glued to any types of tipless cantilevers of Golden and Etalon series.

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