AFM calibration

Company ScanSens manufactures and supplies the full set of calibration standards for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.


TGQ1

Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.

TGT1

Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control.

TGZ1

Calibration grating TGZ1 for SPM Z-axis calibration (step height 20,0±2nm).

TGZ2

Calibration grating TGZ2 for SPM Z-axis calibration (step height 110±2 nm).

TGZ3

Calibration grating TGZ3 for SPM Z-axis calibration (step height 520±3 nm).

TGG1

Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization.

TGX1

Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio.

TGF1

Test grating TGF1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity and lateral force calibration.
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