Magnetic Probes

AFM probes for Magnetic mode (MFM) with CoFe magnetic coating.


HA_FM/CoFe

AFM cantilevers for work in the semicontact mode HA_FM (High Accuracy Force Modulation). Each chip contains two cantilevers with resonance frequencies 114 kHz / 77 kHz and force constant 6 N/m / 3.5 N/m. Probes are covered with CoFe layer for MFM measurements.

HA_FM/HC

AFM cantilevers for work in the semicontact mode HA_FM (High Accuracy Force Modulation). Each chip contains two cantilevers with resonance frequencies 114 kHz / 77 kHz and force constant 6 N/m / 3.5 N/m. Probes are covered with high coercitive 60nm CoCr layer for MFM measurements in external magnetic field.
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