Products


AFM-TERS related products


For many years ScanSens GmbH works together with experienced engineers in AFM + Raman field. In 2010 our collaboration have resulted in manufacturing the first commercially available reliable TERS-activated AFM cantilevers, based on TOP Visual probes' model.

Since that moment we have constantly worked over improvement of TERS cantilevers' characteristics. Our probes allow to get 100x and higher Raman signal enhancement measuring organic molecules. They were successfuly supplied in many laboratories all over the world, bringing us lots of positive references and sometimes even good ideas for future developements.

Knowing that TERS is a tricky experimental method, which conditions may vary from one sample to another one, we also supply test sample for TERS, organic molecules on an Au substrate. Such sample can be used for practical studies of TERS metodology as it was proven to show good Raman signal enhancement with our TERS cantilevers and in correct equipment's and environment's conditions. 
For the similar goal (and for the customers of NT-MDT SI microscopes) we have started recently providing a new special service: TERS demonstration. It includes one day of visit of AFM-Raman engineer with several TERS cantilevers, which work he shows using the standard organic molecules' sample.

AFM probe ETALON series


ETALON is a new series of excellent composite AFM probes with two cantilevers on each chip.

In terms of quality-to-price ratio, it has no analogues in the world market.
 
 
New Brand Technology of ScanSens Combines All Critical Advantages in One Chip:
• Sharp tip (curvature radius less than 10 nm).
• Resonance frequency, specified with high accuracy (±10%).
Two levers on one chip.
• Special chip geometry for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.

Highly Specified Resonance Frequency
The ETALON Series probe have two polysilicon levers with
a pedestal and monocrystal silicon tips.
Precision  technology of polysilicon deposition guarantees the lever thickness control.
A special frequency stabilizer is designed to make the dispersion of the resonant frequency and force constant smaller (due to the lever length control).
Thanks to the above mentioned facts, the ETALON probes are characterized by highly reproducible parameters:
• Typical dispersion of the lever thickness: ±0.15 μm
• Typical dispersion of the lever length: ±2 μm
• Typical dispersion of the probe resonant frequency: ±10%
• Typical dispersion of the force constant: ±20%.

 

Comparison between ETALON and silicon probes

Parameters ETALON probes Silicon cantilevers

Thickness dispersion of the cantilever

± 0.15 µm ± 0.5 µm

Length dispersion of the cantilever

± 2 µm ± 10 µm

Resonant frequency dispersion

± 10% till ± 100%

 

SCAN-GALLERY  of the Images obtained by ETALON Probes

 

AFM probes ETALON Premium series


ETALON Premium is the new generation of polysilicon ETALON probes with high reproducible parameters and pencil-shape narrow tips for high quality AFM imaging.

In terms of quality-to-price ratio, it has no analogues in the world market.
 
Pencil-shape tip for high quality AFM imaging:
 
Etalon Premium tips have got conical apex and cylindrical body to minimize tip-related widening of objects investigated. Excellent geometry provides high resolution of AFM scans:
  • Conical apex of 5-8 nm typical curvature radius and cone angle < 30° suits well for imaging of small objects and nanoparticles;
  • Narrow cylindrical body with diameter of 300 - 700 nm allows getting detailed images of high objects, making Etalon Premium probes being similar to high aspect ratio probes’ models.
 
New Brand Technology of ScanSens Combines All Critical Advantages in One Chip:
• Sharp tip (curvature radius less than 10 nm).
• Resonance frequency, specified with high accuracy (±10%).
Two levers on one chip.
• Special chip geometry for convenient operating.
• High aspect ratio tip.
• Enhanced back-side reflection of the cantilever.

Highly Specified Resonance Frequency
The ETALON Series probe have two polysilicon levers with
a pedestal and monocrystal silicon tips.
Precision  technology of polysilicon deposition guarantees the lever thickness control.
A special frequency stabilizer is designed to make the dispersion of the resonant frequency and force constant smaller (due to the lever length control).
Thanks to the above mentioned facts, the ETALON probes are characterized by highly reproducible parameters:
• Typical dispersion of the lever thickness: ±0.15 μm
• Typical dispersion of the lever length: ±2 μm
• Typical dispersion of the probe resonant frequency: ±10%
• Typical dispersion of the force constant: ±20%.

 

Comparison between ETALON and silicon probes

Parameters ETALON probes Silicon cantilevers

Thickness dispersion of the cantilever

± 0.15 µm ± 0.5 µm

Length dispersion of the cantilever

± 2 µm ± 10 µm

Resonant frequency dispersion

± 10% till ± 100%
 
     

AFM probes GOLDEN series


ScanSens supply with high resolution SPM probes for the main SPM modes.
The probes are supplied with and without reflective coating, with conductive and magnetic coatings to cover the greater part of SPM application range.
Extremely sharp tips allow to obtain high-quality images of your samples.
Probes have standard chip size that makes them compartible with the devices of the most SPM manufactures.

 

Cantilever sets


ScanSens is happy to announce new format of probe puchases. For your convenience we launch new sets which include different probe series for research of different samples by various AFM modes.

UNISETs is the perfect choice for educational purposes or in case you are not sure of the probe type you need for your research and are interested to try different alternatives. 

Super Sharp AFM probes


Super sharp silicon probes with typical curvature radius 1-2nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers.

High aspect ratio AFM cantilevers


High aspect ratio AFM cantilevers are supposed to be used for obtaining high-quality images of high particles and deep trenches on a surface. Their tip's cone angle is usually less then 10 degrees. That allows a tip to get into narrow gaps between particles making excellent topography detalization. This type of probes is presented in our assortment by two models.

Diamond Coated Conductive Probes


The ideal probe for making AFM Oxidation Nanolithography

Stable and nondestructive,wear resistant probe with conductive diamond coating

allows you to make as many images as you want.

TOP VISUAL Probes


SNOM cantilevers new


ScanSens offers SNOM aperture cantilevers for contact and noncontact modes.

SNOM fiber probes


Company ScanSens supply with the SNOM probes for Scanning Near Field Optical Microscopes.

Calibration Gratings


Company ScaSens manufactures and supplies the full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration in X or Y direction), test grating for determination of the tip shape, SNOM test grating.

HOPG, Substrates, Test Samples


Company ScanSens supplies with Highly Oriented Pyrolytic Graphite (HOPG).  It's a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy and scanning tunneling microscopy.
Such HOPG properties as atomic plane surface and good conductivity make it the best material for STM calibration and the excellent substrate for different samples. HOPG is a material that consists of many atomic layers of carbon highly oriented among each other. HOPG is manufactured at the temperature of 3273K and remains stable at the temperatures up to 2000°C in the inert environment. The parallelism of atomic layers is characterized by "mosaic spread angle". The less this angle the higher the quality of HOPG is.

Colloidal probes


ScanSens supplies with special colloidal probes for direct surface force measurement, measurement of adhesion forces, study of colloidal interactions between particle and surface and many other applications.

Vibration isolation systems


We're glad to present the new product line: vibration isolation equipment of our partners, Ostec Instruments.
 
Active vibration isolation platforms of AVOS AR series are based on the voice coil feedback. This progressive technology avoids several problems, such as non-linear response and hard construction, peculiar to piezo- based devices. It allows intelligent integration of a vibration control platform depending on building and environmental properties. The same time specially developed construction provides active isolation in all six degrees of freedom.  
 
Based on multiple independent isolators, active vibration isolation systems of AVOS MD series have possibility to support load capacities of massive machines heavy tool systems. Total available load reachs 4000 kg depending on configuration.
 
Lightweight and compact passive vibration absorption systems of AVOS ST series allow to take in vibration level generating by pumps, compressors, etc.
 
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